R. Dutton

Physical modeling of surface and heterojunction for mesa-structured HBTs

E. Kan, R. Dutton, 1995, GaAs IC Symposium IEEE Gallium Arsenide Integrated Circuit Symposium 17th Annual Technical Digest 1995.

A fast 3D modeling approach to electrical parameters extraction of bonding wires for RF circuits

Xiaoning Qi, T. Arnborg, Robert W. Dutton, 2000 .

Modeling and characterization of three-dimensional effects in physical etching and deposition simulation

D. Bang, Z. Hsiau, E. Kan, 1996, 1996 International Conference on Simulation of Semiconductor Processes and Devices. SISPAD '96 (IEEE Cat. No.96TH8095).

Modeling of temperature dependent contact resistance for analysis of ESD reliability

R. Dutton, K. Banerjee, C. Duvvury, 2003, 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual..

A fast analytical technique for estimating the bounds of on-chip clock wire inductance

Robert W. Dutton, Yi-Chang Lu, Kaustav Banerjee, 2001, Proceedings of the IEEE 2001 Custom Integrated Circuits Conference (Cat. No.01CH37169).

Delay analysis for BiCMOS drivers

Kartikeya Mayaram, Donald O. Pederson, G. P. Rosseel, 1988, Proceedings of the 1988 Bipolar Circuits and Technology Meeting,.

The physical phenomena responsible for excess noise in short-channel MOS devices

Robert W. Dutton, Reza Navid, R. Dutton, 2002, International Conferencre on Simulation of Semiconductor Processes and Devices.

Accurate modeling of GaAs MESFET sidegating effects by trapping simulation

Zhiping Yu, M. Deal, R. Dutton, 1994, Proceedings of 1994 IEEE International Electron Devices Meeting.

Device simulation for RF applications

T. Arnborg, J. Sato-Iwanaga, G. Ma, 1997, International Electron Devices Meeting. IEDM Technical Digest.

1 GHz integrated poly-Si and -SiGe photoconductors with BiCMOS compatibility

J. Morse, A. Hai, R. Dutton, 1991, International Electron Devices Meeting 1991 [Technical Digest].

On-chip inductance modeling and RLC extraction of VLSI interconnects for circuit simulation

Gaofeng Wang, Robert W. Dutton, Zhiping Yu, 2000, Proceedings of the IEEE 2000 Custom Integrated Circuits Conference (Cat. No.00CH37044).

Gate length dependent polysilicon depletion effects

Chang-Hoon Choi, Zhiping Yu, Zhiping Yu, 2002, IEEE Electron Device Letters.