A. Tio
发表
P. Low,
M. Bijl,
J. Westra,
2014
.
J.C.H. Phang,
T. Geinzer,
L. Balk,
2008,
2008 IEEE International Reliability Physics Symposium.
L. Balk,
J. Phang,
Y. Yeo,
2009,
2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.