Peter H. N. De Wit

Analog circuit reliability in sub-32 nanometer CMOS: Analysis and mitigation

Georges G. E. Gielen, Elie Maricau, Peter H. N. De Wit, 2011, 2011 Design, Automation & Test in Europe.

Design automation towards reliable analog integrated circuits

Georges G. E. Gielen, Elie Maricau, Peter H. N. De Wit, 2010, 2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD).

Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies

Georges G. E. Gielen, Montserrat Nafría, Guido Groeseneken, 2008, 2008 Design, Automation and Test in Europe.

An analytical model for hot carrier degradation in nanoscale CMOS suitable for the simulation of degradation in analog IC applications

Georges G. E. Gielen, Elie Maricau, Peter H. N. De Wit, 2008, Microelectron. Reliab..