D. Othman

Comparison study on performances and robustness between SiC MOSFET & JFET devices - Abilities for aeronautics application

Stéphane Lefebvre, Zoubir Khatir, D. Othman, 2012, Microelectron. Reliab..

Robustness of 1.2 kV SiC MOSFET devices

Mounira Berkani, Stéphane Lefebvre, Zoubir Khatir, 2013, Microelectron. Reliab..