Simone Borri

New March Elements for Address Decoder Open and Resistive Open Fault Detection in SRAM Memories

Arnaud Virazel, Luigi Dilillo, Simone Borri, 2008 .

ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March Solutions

Arnaud Virazel, Luigi Dilillo, Patrick Girard, 2006, J. Electron. Test..

Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM Memories

Arnaud Virazel, Luigi Dilillo, Patrick Girard, 2005, J. Electron. Test..

Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test

Arnaud Virazel, Luigi Dilillo, Patrick Girard, 2005, J. Electron. Test..

Resistive-open defects in embedded-SRAM core cells: analysis and march test solution

Arnaud Virazel, Luigi Dilillo, Patrick Girard, 2004, 13th Asian Test Symposium.

Dynamic read destructive fault in embedded-SRAMs: analysis and march test solution

Arnaud Virazel, Luigi Dilillo, Patrick Girard, 2004, Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004..

March iC-: an improved version of March C- for ADOFs detection

Arnaud Virazel, Luigi Dilillo, Patrick Girard, 2004, 22nd IEEE VLSI Test Symposium, 2004. Proceedings..

March Tests Improvements for Address Decoder Open and Resistive Open Fault Detection

Arnaud Virazel, Luigi Dilillo, Simone Borri, 2004 .

Comparison of open and resistive-open defect test conditions in SRAM address decoders

Arnaud Virazel, Luigi Dilillo, Patrick Girard, 2003, 2003 Test Symposium.

Defect-oriented dynamic fault models for embedded-SRAMs

S. Pravossoudovitch, A. Virazel, P. Girard, 2003, The Eighth IEEE European Test Workshop, 2003. Proceedings..