Magali Hage-Hassan

New March Elements for Address Decoder Open and Resistive Open Fault Detection in SRAM Memories

Arnaud Virazel, Luigi Dilillo, Simone Borri, 2008 .

Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM Memories

Arnaud Virazel, Luigi Dilillo, Patrick Girard, 2005, J. Electron. Test..

Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test

Arnaud Virazel, Luigi Dilillo, Patrick Girard, 2005, J. Electron. Test..

Efficient Test of Dynamic Read Destructive Faults in SRAM Memories

Arnaud Virazel, Luigi Dilillo, Patrick Girard, 2005 .

March Tests Improvements for Address Decoder Open and Resistive Open Fault Detection

Arnaud Virazel, Luigi Dilillo, Simone Borri, 2004 .

Defect-oriented dynamic fault models for embedded-SRAMs

S. Pravossoudovitch, A. Virazel, P. Girard, 2003, The Eighth IEEE European Test Workshop, 2003. Proceedings..