M. Bastian

ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March Solutions

Arnaud Virazel, Luigi Dilillo, Patrick Girard, 2006, J. Electron. Test..

Resistive-open defects in embedded-SRAM core cells: analysis and march test solution

Arnaud Virazel, Luigi Dilillo, Patrick Girard, 2004, 13th Asian Test Symposium.

Dynamic read destructive fault in embedded-SRAMs: analysis and march test solution

Arnaud Virazel, Luigi Dilillo, Patrick Girard, 2004, Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004..

A new design-for-test technique for SRAM core-cell stability faults

Arnaud Virazel, Luigi Dilillo, Patrick Girard, 2009, 2009 Design, Automation & Test in Europe Conference & Exhibition.

A Design-for-Diagnosis Technique for SRAM Write Drivers

Arnaud Virazel, Patrick Girard, Serge Pravossoudovitch, 2008, 2008 Design, Automation and Test in Europe.

Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits

Arnaud Virazel, Luigi Dilillo, Patrick Girard, 2007, J. Electron. Test..

Slow Write Driver Faults in 65nm SRAM Technology: Analysis and March Test Solution

Arnaud Virazel, Patrick Girard, Serge Pravossoudovitch, 2007, 2007 Design, Automation & Test in Europe Conference & Exhibition.

Resistive-open defect injection in SRAM core-cell: analysis and comparison between 0.13 /spl mu/m and 90nm technologies

Arnaud Virazel, Luigi Dilillo, Patrick Girard, 2005, Proceedings. 42nd Design Automation Conference, 2005..

Data retention fault in SRAM memories: analysis and detection procedures

Arnaud Virazel, Luigi Dilillo, Patrick Girard, 2005, 23rd IEEE VLSI Test Symposium (VTS'05).