Gary Swift

发表

SEL Site Localization Using Masking and PEM Imaging Techniques: A Case Study on Xilinx 28nm 7-Series FPGAs

William Rudge, Cody Dinkins, William Boesch, 2016, 2016 IEEE Radiation Effects Data Workshop (REDW).

Initial Single Event Effects Testing of the Xilinx Virtex-4 Field Programmable Gate Array

Gary Swift, C. Carmichael, Gregory R. Allen, 2007 .

A model for single-event transients in comparators

L. D. Edmonds, Gary Swift, Allan H. Johnston, 2000 .

Mitigating Single-Event Upsets

Gary Swift, Jameel Hussein, G. Swift, 2015 .

An Analysis of High-Current Events Observed on Xilinx 7-Series and Ultrascale Field-Programmable Gate Arrays

Gary Swift, David S. Lee, Michael Wirthlin, 2016, 2016 IEEE Radiation Effects Data Workshop (REDW).

VIRTEX-4 VQ static SEU Characterization Summary

Gary Swift, C. Carmichael, Gregory R. Allen, 2008 .

A Method and Case Study on Identifying Physically Adjacent Multiple-Cell Upsets Using 28-nm, Interleaved and SECDED-Protected Arrays

Heather Quinn, Gary Swift, Michael Wirthlin, 2014, IEEE Transactions on Nuclear Science.

Single-Event Characterization of the 20 nm Xilinx Kintex UltraScale Field-Programmable Gate Array under Heavy Ion Irradiation

Gary Swift, Gregory R. Allen, David S. Lee, 2014, 2015 IEEE Radiation Effects Data Workshop (REDW).

Invited talk I: The foundations of robustness in reconfigurability in a radiation environment: Understanding single-event effects test results on SRAM-based FPGAs

Gary Swift, 2017, AHS.

Single-Event Upset Mitigation Design Flow for Xilinx FPGA PowerPC Systems

Gary Swift, C. Carmichael, Greg Miller, 2008 .

Single-Event Characterization of Multi-Gigabit Transceivers (MGT) in Space-Grade Virtex-5QV Field Programmable Gate Arrays (FPGA)

Gary Swift, Roberto Monreal, Carl Carmichael, 2010, 2011 IEEE Radiation Effects Data Workshop.

Mitigating upsets in SRAM based FPGAs from the Xilinix Virtex 2 Family.

Gary Swift, C. Carmichael, R. Koga, 2003 .

Recent Single Event Effects Results in Advanced Reconfigurable Field Programmable Gate Arrays

Gary Swift, Gregory R. Allen, Eric Miller, 2010, 2011 IEEE Radiation Effects Data Workshop.

Single-Event Characterization of the 28 nm Xilinx Kintex-7 Field-Programmable Gate Array under Heavy Ion Irradiation

Gary Swift, David S. Lee, Michael Wirthlin, 2014, 2014 IEEE Radiation Effects Data Workshop (REDW).

Single-Event Upset (SEU) Results of Embedded Error Detect and Correct Enabled Block Random Access Memory (Block RAM) Within the Xilinx XQR5VFX130

Gary Swift, Chen Wei Tseng, Larry Edmonds, 2010, IEEE Transactions on Nuclear Science.

Single Event Effect Rate Analysis and Upset Characterization of FPGA Digital Signal Processors

Gary Swift, Brent Nelson, Michael Wirthlin, 2013, 2013 IEEE Radiation Effects Data Workshop (REDW).

Upset Characterization of the PowerPC405 Hard-core Processor Embedded in Virtex-II Pro Field Programmable Gate Arrays

Gary Swift, Farhad Farmanesh, Fayez Chayab, 2006 .

Single-Event Upset ( SEU ) Results of Embedded Error Detect and Correct Enabled Block Random Access Memory ( Block RAM ) within the Xilinx XQR 5 VFX 130

Gary Swift, Gregory R. Allen, Chen Wei Tseng, .