A.B.M. Jansman

Comparison of the "pad-open-short" and "open-short-load" deembedding techniques for accurate on-wafer RF characterization of high-quality passives

L.F. Tiemeijer, R.J. Havens, A.B.M. Jansman, 2005, IEEE Transactions on Microwave Theory and Techniques.

C-V characterization of MOS capacitors on high resistivity silicon substrate

A.B.M. Jansman, L.K. Nanver, J.N. Burghartz, 2003, ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003..

Elimination of accumulation charge effects for high-resistive silicon substrates

J.T.M. van Beek, A.B.M. Jansman, A. den Dekker, 2003, ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003..

4D-3 A 2 GHz Reference Oscillator incorporating a Temperature Compensated BAW Resonator

A.B.M. Jansman, A. Oruk, R. Milsom, 2006, 2006 IEEE Ultrasonics Symposium.