V. Brouzet
发表
L. Latu-Romain,
G. Patriarche,
T. Baron,
2014
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Full Wafer Process Control Through Object Detection Using Region-Based Convolutional Neural Networks
J. Tortai,
R. Duru,
D. Le Cunff,
2022,
2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).
Gerard Ghibaudo,
Thierry Baron,
P. Periwal,
2015
.
L. Latu-Romain,
M. Ollivier,
E. Bano,
2015
.
T. Baron,
M. Legallais,
C. Ternon,
2015
.
T. Baron,
M. Legallais,
C. Ternon,
2015
.