S. Bönisch

High precision differential measurement of surface photovoltage transients on ultrathin CdS layers.

T. Dittrich, P. Zabel, S. Bönisch, 2008, The Review of scientific instruments.

Broadband measurement of the conductivity and the permittivity of semiconducting materials in high voltage XLPE cables

David Pommerenke, Roman Jobava, R. Heinrich, 2000 .

Modeling of short-gap ESD under consideration of different discharge mechanisms

David Pommerenke, W. Kalkner, S. Bonisch, 2003 .