Andrei Tkachuk

发表

X-ray microscopy for in situ characterization of 3D nanostructural evolution in the laboratory

Philip J. Withers, Michael Feser, Robert S. Bradley, 2015, SPIE Optical Engineering + Applications.

High-resolution x-ray tomography using laboratory sources

Hongtao Cui, Michael Feser, Fred Duewer, 2006, SPIE Optics + Photonics.

Open-faced z-shaped channel-cut x-ray monochromator

Albert T. Macrander, Ruben Khachatryan, Jun Qian, 2004, SPIE Optics + Photonics.

Non Destructive Failure Analysis Technique With a Laboratory Based 3D X-ray Nanotomography System

Hongtao Cui, Michael Feser, Fred Duewer, 2006 .

In Situ Laboratory-Based Transmission X-Ray Microscopy and Tomography of Material Deformation at the Nanoscale

Philip J. Withers, Robert S. Bradley, Amy J. Clarke, 2016 .

Composition characterization of combinatorial materials by scanning X-ray fluorescence microscopy using microfocused synchrotron X-ray beam

Yong S. Chu, Stefan Vogt, Andrei Tkachuk, 2004 .

X‐ray Microscopy for Interconnect Characterization

Jeff Gelb, Michael Feser, Wenbing Yun, 2009 .

X-ray computed tomography in Zernike phase contrast mode at 8 keV with 50-nm resolution using Cu rotating anode X-ray source

Hongtao Cui, Michael Feser, Fred Duewer, 2007 .

A 30 nm-resolution hard X-ray microscope with X-ray fluorescence mapping capability at BSRF.

Kai Zhang, Youli Hong, Ziyu Wu, 2012, Journal of synchrotron radiation.

Imaging Integrated Circuits with X-ray Microscopy

Stephen R. Aylward, J. Rudati, Gene Wagenbreth, 2011 .

Sub-micron resolution CT for failure analysis and process development

Jeff Gelb, Hongtao Cui, Michael Feser, 2008 .

Nondestructive Reconstruction and Analysis of SOFC Anodes Using X-ray Computed Tomography at Sub-50 nm Resolution

Wilson K. S. Chiu, Kyle N. Grew, Wenbing Yun, 2008 .

Sub-micron X-ray Computed Tomography for Non-Destructive 3D Visualization and Analysis

Jeff Gelb, Michael Feser, Wenbing Yun, 2009, Microscopy and Microanalysis.

Non Destructive Characterization, Inspection, Failure Analysis of Advanced Components and Sensors With a High Resolution & High Contrast Microtomography (microCT) System

Michael Feser, Wenbing Yun, Andrei Tkachuk, 2006 .

Structural investigation of CoMnGe combinatorial epitaxial thin films using microfocused synchrotron X-ray

Derrick C. Mancini, Yong S. Chu, Stefan Vogt, 2004 .