C. R. Parthasarathy

Design-In Reliability for 90-65nm CMOS Nodes Submitted to Hot-Carriers and NBTI Degradation

M. Denais, Vincent Huard, C. Guérin, 2007, PATMOS.

A thorough investigation of MOSFETs NBTI degradation

M. Denais, Vincent Huard, Nathalie Revil, 2005, Microelectron. Reliab..

Activity profiling: Review of different solutions to develop reliable and performant design

Lorena Anghel, Vincent Huard, Florian Cacho, 2016, 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS).

Timing in-situ monitors: Implementation strategy and applications results

Lorena Anghel, Fabien Giner, Vincent Huard, 2015, 2015 IEEE Custom Integrated Circuits Conference (CICC).

Impacts of the recovery phenomena on the worst-case of damage in DC/AC stressed ultra-thin NO gate-oxide MOSFETs

M. Denais, Vincent Huard, Didier Goguenheim, 2005, Microelectron. Reliab..

Designing in reliability in advanced CMOS technologies

G. Ribes, M. Denais, Vincent Huard, 2006, Microelectron. Reliab..

NBTI degradation: From physical mechanisms to modelling

M. Denais, Vincent Huard, C. R. Parthasarathy, 2006, Microelectron. Reliab..

Dynamic aging compensation and Safety measures in Automotive environment

Sylvie Naudet, Vincent Huard, Florian Cacho, 2017, 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS).

Cognitive approach to support dynamic aging compensation

David Meyer, Sylvie Naudet, Vincent Huard, 2017, 2017 IEEE International Test Conference (ITC).