Ali E. Kayaalp

High Speed Machine Perception Using Passive Sensing Technology

Ali E. Kayaalp, 1990, Other Conferences.

Machine Vision for Semiconductor Wafer Inspection

A. R. Rao, Ramesh Jain, A. Ravishankar Rao, 1989 .

Scanning electron microscope-based stereo analysis

Ramesh C. Jain, A. Ravishankar Rao, Ali E. Kayaalp, 2005, Machine Vision and Applications.

Near real-time stereo range detection using a pipeline architecture

Ali E. Kayaalp, James L. Eckman, 1990, IEEE Trans. Syst. Man Cybern..

A Pipeline Architecture For Near Real-Time Stereo Range Detection

Ali E. Kayaalp, James L. Eckman, 1989, Other Conferences.

High-speed sensor-based systems for mobile robotics

Saied Moezzi, Ali E. Kayaalp, Henry C. Davies, 1991 .

Towards real-time binocular stereo range and motion detection

Ali E. Kayaalp, 1990, Defense, Security, and Sensing.

Scanning electron microscope based stereo analysis (for semiconductor IC inspection)

Ramesh C. Jain, A. Ravishankar Rao, A. R. Rao, 1989, Proceedings CVPR '89: IEEE Computer Society Conference on Computer Vision and Pattern Recognition.

Using SEM Stereo To Extract Semiconductor Wafer Pattern Topography

Ramesh Jain, Ali E. Kayaalp, 1987, Advanced Lithography.

Model Based Inspection Of Integrated Circuit Patterns Using The Scanning Electron Microscope (Sem)

Ramesh Jain, Ali E. Kayaalp, 1987, Advanced Lithography.