Samuel Dodge

Locally Adaptive Statistical Background Modeling With Deep Learning-Based False Positive Rejection for Defect Detection in Semiconductor Units

Martin W. Braun, Lina J. Karam, Samuel F. Dodge, 2020, IEEE Transactions on Semiconductor Manufacturing.

Finding Task-Relevant Features for Few-Shot Learning by Category Traversal

Xiaogang Wang, David Eigen, Hongyang Li, 2019, 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR).

An evaluation of attention models for use in SLAM

Lina J. Karam, Samuel Dodge, 2013, Electronic Imaging.

Human and DNN Classification Performance on Images With Quality Distortions

Samuel F. Dodge, Samuel Dodge, Lina Karam, 2019, ACM Trans. Appl. Percept..