J. Segura

Analysis and modeling of MOS devices with gate oxide short failures

Antonio Rubio, Joan Figueras, J. Segura, 1991, 1991., IEEE International Sympoisum on Circuits and Systems.

A detailed analysis of CMOS SRAM's with gate oxide short defects

J. Segura, A. Rubio, 1997 .

I/sub ddq/ secondary components in CMOS logic circuits preceded by defective stages affected by analogue type faults

Antonio Rubio, Joan Figueras, J. Segura, 1991 .

CMOS radiation sensor with binary output

Benjamin Iniguez, J. Segura, E. G. Moreno, 1995 .