Shipeng Shangguan

Study on the single-event upset sensitivity of 65-nm CMOS sequential logic circuit

Rui Chen, Xuan Wang, Sai Li, 2020, IEICE Electron. Express.

Primary investigation the impacts of the external memory (DDR3) failures on the performance of Xilinx Zynq-7010 SoC based system (MicroZed) using laser irradiation

Yao Zhang, Yuan Yuan, Yonghong Li, 2017 .

Comparison of single-event upset generated by heavy ion and pulsed laser

Bin Liang, Rui Chen, Jianjun Chen, 2016, Science China Information Sciences.