R. Coppard

In situ study of the growth kinetics and interfacial roughness during the first stages of nickel-silicide formation

F. Nemouchi, D. Mangelinck, E. Ziegler, 2006 .

Influence of the semi-conductor layer thickness on electrical performance of staggered n- and p-channel organic thin-film transistors

Romain Coppard, Isabelle Chartier, Gilles Horowitz, 2010 .