Patrick Mertens

Modeling the Distribution of Normal Data in Pre-Trained Deep Features for Anomaly Detection pdf

Dorit Merhof, Oliver Rippel, Patrick Mertens, 2020, 2020 25th International Conference on Pattern Recognition (ICPR).

Gaussian Anomaly Detection by Modeling the Distribution of Normal Data in Pretrained Deep Features

Dorit Merhof, Oliver Rippel, Patrick Mertens, 2021, IEEE Transactions on Instrumentation and Measurement.