Chris Chan

Defect cluster recognition system for fabricated semiconductor wafers

Ye Chow Kuang, Melanie Po-Leen Ooi, Serge Demidenko, 2013, Eng. Appl. Artif. Intell..

Getting More From the Semiconductor Test: Data Mining With Defect-Cluster Extraction

Lindsay Kleeman, Serge N. Demidenko, Ye Chow Kuang, 2011, IEEE Transactions on Instrumentation and Measurement.

Evaluating the Performance of Different Classification Algorithms for Fabricated Semiconductor Wafers

Serge N. Demidenko, Ye Chow Kuang, Melanie Po-Leen Ooi, 2010, 2010 Fifth IEEE International Symposium on Electronic Design, Test & Applications.

Identifying Systematic Failures on Semiconductor Wafers Using ADCAS

Serge N. Demidenko, Ye Chow Kuang, Melanie Po-Leen Ooi, 2013, IEEE Design & Test.