H. Jung

Amorphous InGaZnO Thin-Film Transistors—Part I: Complete Extraction of Density of States Over the Full Subband-Gap Energy Range

Hyungtak Kim, D. M. Kim, D. Kim, 2012, IEEE Transactions on Electron Devices.

Comparative analysis of temperature thermally induced instability between Si–In–Zn–O and Ga–In–Zn–O thin film transistors

Sang Yeol Lee, D. Kim, Do Hyung Kim, 2012 .

Effect of interface states on the instability under temperature stress in amorphous SiInZnO thin film transistor

Sang Yeol Lee, D. Kim, Do Hyung Kim, 2011 .

Origin of instability by positive bias stress in amorphous Si-In-Zn-O thin film transistor

Donghyeon Yoo, Sang Yeol Lee, D. Kim, 2011 .

Empirical Modeling and Extraction of Parasitic Resistance in Amorphous Indium–Gallium–Zinc Oxide Thin-Film Transistors

Dong Myong Kim, Dae Hwan Kim, Jun-Hyun Park, 2011, IEEE Transactions on Electron Devices.