Ivica Manic

发表

Effects of low gate bias annealing in NBT stressed p-channel power VDMOSFETs

Ivica Manic, Danijel Dankovic, Snezana Djoric-Veljkovic, 2009, Microelectron. Reliab..

International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2019, Hsinchu, Taiwan, April 22-25, 2019

Ivica Manic, Hyatt Regency Cambridge, Margaret Kindling, 2019, VLSI-DAT.

A review of pulsed NBTI in P-channel power VDMOSFETs

Ivica Manic, Danijel Dankovic, Snezana Djoric-Veljkovic, 2018, Microelectron. Reliab..

Effects of burn-in stressing on post-irradiation annealing response of power VDMOSFETs

Ivica Manic, Snezana Djoric-Veljkovic, Snezana Golubovic, 2003, Microelectron. Reliab..

Mechanisms of positive gate bias stress induced instabilities in power VDMOSFETs

Ivica Manic, Snezana Djoric-Veljkovic, Vojkan Davidovic, 2001, Microelectron. Reliab..

Microwave Engineering: Concepts and Fundamentals, Ahmad Shahid Khan. CRC Press Taylor & Francis Group, Boca Raton (2014). 800 p., Hardcover, ISBN: 9781466591417

Ivica Manic, 2015, Microelectron. Reliab..

Mechanisms of spontaneous recovery in positive gate bias stressed power VDMOSFETs

Ivica Manic, Danijel Dankovic, Snezana Djoric-Veljkovic, 2002, Microelectron. Reliab..

Effects of high electric field and elevated-temperature bias stressing on radiation response in power VDMOSFETs

Ivica Manic, Snezana Djoric-Veljkovic, Snezana Golubovic, 2002, Microelectron. Reliab..

Ivica Manic, Danijel Dankovic, Snezana Djoric-Veljkovic, 2011, Microelectron. Reliab..

NBTI and irradiation related degradation mechanisms in power VDMOS transistors

Ivica Manic, Danijel Dankovic, Snezana Djoric-Veljkovic, 2018, Microelectron. Reliab..

Effects of electrical stressing in power VDMOSFETs

Ivica Manic, Danijel Dankovic, Snezana Djoric-Veljkovic, 2005, Microelectron. Reliab..

NBT stress-induced degradation and lifetime estimation in p-channel power VDMOSFETs

Ivica Manic, Danijel Dankovic, Snezana Djoric-Veljkovic, 2006, Microelectron. Reliab..

Negative bias temperature instability mechanisms in p-channel power VDMOSFETs

Ivica Manic, Danijel Dankovic, Snezana Djoric-Veljkovic, 2005, Microelectron. Reliab..

Spontaneous Recovery in DC Gate Bias Stressed Power VDMOSFETs

Ivica Manic, Danijel Dankovic, Snezana Djoric-Veljkovic, 2006, 2006 25th International Conference on Microelectronics.

Negative bias temperature instabilities in sequentially stressed and annealed p-channel power VDMOSFETs

Ivica Manic, Danijel Dankovic, Snezana Djoric-Veljkovic, 2007, Microelectron. Reliab..

Threshold voltage instabilities in p-channel power VDMOSFETs under pulsed NBT stress

Ivica Manic, Danijel Dankovic, Snezana Djoric-Veljkovic, 2010, Microelectron. Reliab..

Negative bias temperature instability in p-channel power VDMOSFETs: recoverable versus permanent degradation

Ivica Manic, Danijel Dankovic, Vojkan Davidovic, 2015 .

Effects of negative gate bias stressing in thick gate oxides for power VDMOSFETS

Ivica Manic, Danijel Dankovic, Vojkan Davidovic, 2003 .

Negative Bias Temperature Instability in Thick Gate Oxides for Power MOS Transistors

Ivica Manic, Danijel Dankovic, Vojkan Davidovic, 2014 .

NBTI and Irradiation Effects in P-Channel Power VDMOS Transistors

Ivica Manic, Danijel Dankovic, Vojkan Davidovic, 2016, IEEE Transactions on Nuclear Science.

EFFECTS OF PULSED NEGATIVE BIAS TEMPERATURE STRESSING IN P-CHANNEL POWER VDMOSFETS

Ivica Manic, Danijel Dankovic, Vojkan Davidovic, 2016 .

Effects of consecutive irradiation and bias temperature stress in p-channel power vertical double-diffused metal oxide semiconductor transistors

Ivica Manic, Danijel Dankovic, Vojkan Davidovic, 2018 .

A method for negative bias temperature instability (NBTI) measurements on power VDMOS transistors

Ivica Manic, Danijel Dankovic, Ninoslav Stojadinovic, 2012 .

Effects of gate bias stressing in power VDMOSFETs

Ivica Manic, Danijel Dankovic, Vojkan Davidovic, 2003 .

Effects of burn-in stressing on radiation response of power VDMOSFETs

Ivica Manic, Vojkan Davidovic, Ninoslav Stojadinovic, 2002 .

Effects of γ-irradiation on electrical characteristics of power vdmos transistors

Ivica Manic, Snezana Golubovic, Z. Pavlovic, 2002 .

Analysis of recoverable and permanent components of threshold voltage shift in NBT stressed p-channel power VDMOSFET

Ivica Manic, Danijel Dankovic, Vojkan Davidovic, 2015 .