Mingren Wu

Improved Visual Inspection through 3D Image Reconstruction of Defects Based on the Photometric Stereo Technique

Ming Li, Ke Xu, Sanao Huang, 2019, Sensors.

Inspection and Classification of Semiconductor Wafer Surface Defects Using CNN Deep Learning Networks

Jiann-Der Lee, Jong-Chih Chien, Ming-Tao Wu, 2020, Applied Sciences.

Surface Rolled-in Defects of Titanium Hot Roll Band in HSM

Yeong-Tsuen Pan, Wei‐Lin Wang, Chao-chi Huang, 2015 .