Ninoslav Stojadinovic

发表

Effects of low gate bias annealing in NBT stressed p-channel power VDMOSFETs

Ivica Manic, Danijel Dankovic, Snezana Djoric-Veljkovic, 2009, Microelectron. Reliab..

Temperature dependence of on-resistance in low-voltage power VDMOS transistors

Ninoslav Stojadinovic, Z. Pavlovic, Zoran Prijić, 1993 .

A review of pulsed NBTI in P-channel power VDMOSFETs

Ivica Manic, Danijel Dankovic, Snezana Djoric-Veljkovic, 2018, Microelectron. Reliab..

New analytical expression for the drain current of short-channel MOS transistors in the triode region

Ninoslav Stojadinovic, Sima Dimitrijev, D. Zupac, 1987 .

Influence of polysilicon film thickness on radiation response of advanced excimer laser annealed polycrystalline silicon thin film transistors

Vojkan Davidovic, Ninoslav Stojadinovic, Dimitrios N. Kouvatsos, 2007, Microelectron. Reliab..

Degradation behavior of Ta2O5 stacks and its dependence on the gate electrode

Ninoslav Stojadinovic, Albena Paskaleva, Elena Atanassova, 2008, Microelectron. Reliab..

Modeling of integrated circuit yield loss mechanisms

Ninoslav Stojadinovic, Sima Dimitrijev, Zoran Stamenkovic, 1996 .

Mechanisms of spontaneous recovery in positive gate bias stressed power VDMOSFETs

Ivica Manic, Danijel Dankovic, Snezana Djoric-Veljkovic, 2002, Microelectron. Reliab..

Failure physics of integrated circuits — A review

Ninoslav Stojadinovic, N. Stojadinovic, 1983 .

33 Countries Represented at 2010 International Conference on Microelectronics (MIEL) in Nis, Serbia [Chapters]

Ninoslav Stojadinovic, 2010 .

In memory of D. Stewart Peck

Ninoslav Stojadinovic, Michael G. Pecht, Michael G. Pecht, 2001, Microelectron. Reliab..

A review of long-channel MOS transistor models

Ninoslav Stojadinovic, Andrzej Jakubowski, Sima Dimitrijev, 1991 .

28th International Conference on Microelectronics Sponsored by SSCS-Serbia/Montenegro Chapters in May: Over 100 Converge from 22 Countries; Nearly 100 Papers [Chapters]

Danijel Dankovic, Ninoslav Stojadinovic, 2012 .

Music - a multigrid simulator for IC fabrication processes

Ninoslav Stojadinovic, Zoran Prijić, S. Mijalkovic, 1991 .

Ivica Manic, Danijel Dankovic, Snezana Djoric-Veljkovic, 2011, Microelectron. Reliab..

2017 International Conference on Microelectronics [Conference Reports]

Danijel Dankovic, Ninoslav Stojadinovic, 2018 .

NBTI and irradiation related degradation mechanisms in power VDMOS transistors

Ivica Manic, Danijel Dankovic, Snezana Djoric-Veljkovic, 2018, Microelectron. Reliab..

Effects of electrical stressing in power VDMOSFETs

Ivica Manic, Danijel Dankovic, Snezana Djoric-Veljkovic, 2005, Microelectron. Reliab..

Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors

Vojkan Davidovic, Ninoslav Stojadinovic, D. Goustouridis, 2004, Microelectron. Reliab..

High temperature storage life (HTSL) and high temperature reverse bias (HTRB) reliability testing of power VDMOSFETs

Ninoslav Stojadinovic, N. Tosic, B. Pesic, 1995, Proceedings of International Conference on Microelectronics.

Pre-breakdown electron trapping in irradiated and annealed oxides

Ninoslav Stojadinovic, D. Manic, B. Pesic, 1995, Proceedings of International Conference on Microelectronics.

Serbia and Montenegro ED/SSC Chapter Promotes EE as a Career, Sponsors Miel 2006 Drawing Attendees from 32 Countries

Ninoslav Stojadinovic, 2006 .

Integrated circuit production yield assurance based on yield analysis

Ninoslav Stojadinovic, Sima Dimitrijev, Zoran Stamenkovic, 1993 .

Reliability testing of power VDMOS transistors

Ninoslav Stojadinovic, N. Tosic, B. Pesic, 1997, 1997 21st International Conference on Microelectronics. Proceedings.

Spontaneous Recovery in DC Gate Bias Stressed Power VDMOSFETs

Ivica Manic, Danijel Dankovic, Snezana Djoric-Veljkovic, 2006, 2006 25th International Conference on Microelectronics.

Simple method for the extraction of power VDMOS transistor parameters

Ninoslav Stojadinovic, Z. Pavlovic, Zoran Prijić, 1996 .

A new CMOS IC structure and its characterization

Ninoslav Stojadinovic, Z. Živić, A. Živić, 1985 .

2014 International Conference on Microelectronics (MIEL) [Chapters]

Ninoslav Stojadinovic, 2014 .

Understanding Semiconductor Devices; Sima Dimitrijev. Oxford University Press, New York. 2000. ISBN: 0-19-513186-X

Ninoslav Stojadinovic, 2001, Microelectron. Reliab..

Threshold voltage instabilities in p-channel power VDMOSFETs under pulsed NBT stress

Ivica Manic, Danijel Dankovic, Snezana Djoric-Veljkovic, 2010, Microelectron. Reliab..

Yield model for in-line integrated circuit production control

Ninoslav Stojadinovic, Sima Dimitrijev, Zoran Stamenkovic, 1988 .

Chip yield modeling related to photolithographic defects

Ninoslav Stojadinovic, Zoran Stamenkovic, N. Stojadinovic, 1992 .

Dependability of Engineering Systems: J.M. Nahman, Springer-Verlag, Berlin, Heidelberg, New York, 2002, 192 pages

Ninoslav Stojadinovic, 2002, Microelectron. Reliab..

Power semiconductor devices — continuous development

Ninoslav Stojadinovic, Paolo Spirito, 1996 .

New defect size distribution function for estimation of chip critical area in integrated circuit yield models (CMOS)

Ninoslav Stojadinovic, Zoran Stamenkovic, N. Stojadinovic, 1992 .

Analysis of gamma-irradiation induced degradation mechanisms in power VDMOSFETS

Ninoslav Stojadinovic, Sima Dimitrijev, S. Dimitrijev, 1995 .

Effects of emitter diffusion‐induced stresses on the common‐emitter current gain of silicon planar transistors

Ninoslav Stojadinovic, S. D. Ristić, N. Stojadinovic, 1979 .

Negative bias temperature instability in p-channel power VDMOSFETs: recoverable versus permanent degradation

Ivica Manic, Danijel Dankovic, Vojkan Davidovic, 2015 .

Effects of negative gate bias stressing in thick gate oxides for power VDMOSFETS

Ivica Manic, Danijel Dankovic, Vojkan Davidovic, 2003 .

Breakdown properties of thin oxides in irradiated MOS capacitors

Ninoslav Stojadinovic, Andrzej Jakubowski, Tomasz Brozek, 1993 .

Modeling Radiation-Induced Mobility Degradation in MOSFETs

Vojkan Davidovic, Ninoslav Stojadinovic, Sima Dimitrijev, 1998 .

Investigation of gate oxide breakdown in CMOS integrated circuits

Ninoslav Stojadinovic, Sima Dimitrijev, S. Dimitrijev, 1989 .

An efficient multiparticle diffusion simulation by an adaptive multigrid method

Ninoslav Stojadinovic, S. Mijalkovic, D. Pantić, 1994 .

Analysis of CMOS transistor instabilities

Ninoslav Stojadinovic, Sima Dimitrijev, S. Dimitrijev, 1987 .

Negative Bias Temperature Instability in Thick Gate Oxides for Power MOS Transistors

Ivica Manic, Danijel Dankovic, Vojkan Davidovic, 2014 .

Effect of radiation-induced oxide-trapped charge on mobility in p-channel MOSFETs

Vojkan Davidovic, Ninoslav Stojadinovic, Sima Dimitrijev, 1995 .

NBTI and Irradiation Effects in P-Channel Power VDMOS Transistors

Ivica Manic, Danijel Dankovic, Vojkan Davidovic, 2016, IEEE Transactions on Nuclear Science.

The contribution of border traps to the threshold voltage shift in pMOS dosimetric transistors

Ninoslav Stojadinovic, Branislav Radjenović, Momčilo M. Pejović, 1995 .

The determination of zero temperature coefficient point in CMOS transistors

Ninoslav Stojadinovic, Zoran Prijić, Sima Dimitrijev, 1992 .

Effects of high field stresses on threshold voltage of CMOS transistors

Ninoslav Stojadinovic, S. Mijalkovic, Sima Dimitrijev, 1985 .

EFFECTS OF PULSED NEGATIVE BIAS TEMPERATURE STRESSING IN P-CHANNEL POWER VDMOSFETS

Ivica Manic, Danijel Dankovic, Vojkan Davidovic, 2016 .

Radiation hardening of power MOSFETs using electrical stress

Vojkan Davidovic, Ninoslav Stojadinovic, S. Djoric-Veljkovic, 2002 .

Effects of consecutive irradiation and bias temperature stress in p-channel power vertical double-diffused metal oxide semiconductor transistors

Ivica Manic, Danijel Dankovic, Vojkan Davidovic, 2018 .

Zero-temperature-coefficient (ZTC) biasing of power VDMOS transistors

Ninoslav Stojadinovic, Zoran Prijić, S. D. Ristić, 1993 .

A method for negative bias temperature instability (NBTI) measurements on power VDMOS transistors

Ivica Manic, Danijel Dankovic, Ninoslav Stojadinovic, 2012 .

Analysis of temperature dependence of CMOS transistors' threshold voltage

Ninoslav Stojadinovic, Zoran Prijić, Sima Dimitrijev, 1991 .

Effects of gate bias stressing in power VDMOSFETs

Ivica Manic, Danijel Dankovic, Vojkan Davidovic, 2003 .

Influence of emitter edge dislocations on reliability of planar NPN transistors

Ninoslav Stojadinovic, N. Stojadinovic, 1982 .

Effects of burn-in stressing on radiation response of power VDMOSFETs

Ivica Manic, Vojkan Davidovic, Ninoslav Stojadinovic, 2002 .

Instabilities in MOS transistors

Ninoslav Stojadinovic, Sima Dimitrijev, S. Dimitrijev, 1989 .

Mechanisms of positive gate bias stress induced instabilities in power VDMOSFETs

Ivica Manic, Snezana Djoric-Veljkovic, Vojkan Davidovic, 2001, Microelectron. Reliab..

High-temperature-reverse-bias testing of power VDMOS transistors

Ninoslav Stojadinovic, B. Pesic, N. Tosic, 1997 .

Analysis of recoverable and permanent components of threshold voltage shift in NBT stressed p-channel power VDMOSFET

Ivica Manic, Danijel Dankovic, Vojkan Davidovic, 2015 .

Analysis of gamma-radiation induced instability mechanisms in CMOS transistors

Ninoslav Stojadinovic, Sima Dimitrijev, Momčilo M. Pejović, 1989 .

Charge-pumping characterization of SiO/sub 2//Si interface in virgin and irradiated power VDMOSFETs

P. Habas, Ninoslav Stojadinovic, Z. Prijic, 1996 .