Wang Senling

发表

Capture Power Evaluation for A Low Power BIST Method Using A TEG Chip

Nishida Toshiya, Wang Senling, Sato Yasuo, 2014 .

Implementation of Precision Resistance Measurement of TSVs Using Analog Boundary Scan

Takahashi Hiroshi, Wang Senling, Kagawa Keisuke, 2015 .

A Scan-Out Power Reduction Method for Multi-Cycle BIST

Wang Senling, Sato Yasuo, Kajihara Seiji, 2012 .

Design for Evaluation of TSV based Interconnections in 3D-SIC -- Interconnection Resistance Evaluation with Analog Boundary Scan

Wang Senling, Takahashi Hiroshi, Kameyama Shuichi, 2017 .

An Evaluation of Low Power BIST Method

Wang Senling, Sato Yasuo, Kajihara Seiji, 2012 .

Built-In Self Diagnosis Architecture for Logic Design

Ohtake Satoshi, Takahashi Hiroshi, Wang Senling, 2017 .

Evaluation of Flexible Test Power Control for Logic BIST in TEG Chips

Wang Senling, Sato Yasuo, Kajihara Seiji, 2018 .

A Simulated Annealing based Low IR Drop Pattern Selection Method for Resistive Open Fault Diagnosis

Takahashi Hiroshi, Wang Senling, Higami Yoshinobu, 2015 .

Testing the Bridge Interconnect Fault for Memory based Reconfigurable Logic Device (MRLD)

Sato Masayuki, Wang Senling, Higami Yoshinobu, 2018 .

FF Toggle Control Point Selection Methods for Fault Detection Enhancement under Multi-cycle Testing

Wang Senling, Maeda Yoichi, Higami Yoshinobu, 2019 .

Analog Circuit Design for a Precision Resistance Measurement of TSVs

Takahashi Hiroshi, Wang Senling, Kagawa Keisuke, 2016 .

A method to reduce shift-toggle rate for low power BIST

Wang Senling, Sato Yasuo, Kajihara Seiji, 2012 .

Flip-Flop Selection for Multi-Cycle Test with Partial Observation in Scan-Based Logic BIST

Wang Senling, Sato Yasuo, Kajihara Seiji, 2017 .

Analysis of Fault Detection Degradation Issue in Multi-cycle Test Scheme using Probabilistic Evaluation Method

Wang Senling, Maeda Yoichi, Higami Yoshinobu, 2019 .

Structure-Based Methods for Selecting Fault-Detection-Strengthened FF under Multi-cycle Test with Sequential Observation

Wang Senling, Higami Yoshinobu, Matsushima Jun, 2016 .