Z. Khatir

Influence of repetitions of short-circuit conditions on IGBT lifetime

F. Saint-Eve, S. Lefebvre, Z. Khatir, 2005 .

Experimental validation of a thermal modelling method dedicated to multichip power modules in operating conditions

Z. Khatir, S. Carubelli, 2003, Microelectron. J..

Real-time computation of thermal constraints in multichip power electronic devices

Z. Khatir, S. Carubelli, F. Lecoq, 2004, IEEE Transactions on Components and Packaging Technologies.

Reliability of CoolMOS/spl trade/ under extremely hard repetitive electrical working conditions

Z. Khatir, S. Lefebvre, F. Saint-Eve, 2003, ISPSD '03. 2003 IEEE 15th International Symposium on Power Semiconductor Devices and ICs, 2003. Proceedings..

Experimental and numerical analysis of GTO's snubberless turn-off operations

Z. Khatir, D. Sebille, Ph. Larguier, 1996 .