D. Kay

CTL the language for describing core-based test

Rohit Kapur, Brion L. Keller, Maurice Lousberg, 2001, Proceedings International Test Conference 2001 (Cat. No.01CH37260).

Unified fault management using Logic Built-In Self-Test and logic bitmap

Douglas Kay, Matthias Kamm, Lien Tran, 2009, 2009 IEEE/SEMI Advanced Semiconductor Manufacturing Conference.

Controllable LFSR for BIST

Samiha Mourad, D. Kay, S. Mourad, 2000, Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference [Cat. No. 00CH37066].

Deterministic bist in partial scan environment

Samiha Mourad, B. S. Greene, D. Kay, 2003, Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412).