Byungil Ryu

70nm DRAM technology for DDR-3 application

Hyungtak Kim, Sangho Kim, Kinam Kim, 2005, IEEE VLSI-TSA International Symposium on VLSI Technology, 2005. (VLSI-TSA-Tech)..

Bit line coupling scheme and electrical fuse circuit for reliable operation of high density DRAM

Jinseok Lee, Byungil Ryu, Sangseok Kang, 2001, 2001 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.01CH37185).