S. Clima

发表

G. Groeseneken, R. Degraeve, L. Goux, 2013, 2013 Symposium on VLSI Technology.

R. Degraeve, L. Goux, B. Govoreanu, 2016, 2016 IEEE International Reliability Physics Symposium (IRPS).

A. Cabrini, G. Torelli, R. Degraeve, 2015, 2015 IEEE International Electron Devices Meeting (IEDM).

R. Degraeve, L. Goux, B. Govoreanu, 2015, 2015 Symposium on VLSI Technology (VLSI Technology).

R. Degraeve, L. Goux, B. Govoreanu, 2012, 2012 IEEE International Integrated Reliability Workshop Final Report.

R. Degraeve, L. Goux, B. Govoreanu, 2014, Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

R. Degraeve, L. Goux, B. Govoreanu, 2013, IEEE Electron Device Letters.

R. Degraeve, L. Goux, B. Govoreanu, 2013, 2013 5th IEEE International Memory Workshop.

R. Degraeve, B. Kaczer, D. Linten, 2015, 2015 IEEE International Electron Devices Meeting (IEDM).

R. Degraeve, L. Goux, A. Fantini, 2015, 2015 IEEE International Electron Devices Meeting (IEDM).

R. Degraeve, L. Goux, Z. Chai, 2019, 2019 Symposium on VLSI Technology.

R. Delhougne, R. Degraeve, L. Goux, 2019, 2019 IEEE International Electron Devices Meeting (IEDM).

R. Degraeve, L. Goux, Z. Chai, 2019, 2019 IEEE International Electron Devices Meeting (IEDM).

R. Degraeve, L. Goux, B. Govoreanu, 2014, 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers.