S. Clima
发表
G. Groeseneken,
R. Degraeve,
L. Goux,
2013,
2013 Symposium on VLSI Technology.
R. Degraeve,
L. Goux,
B. Govoreanu,
2016,
2016 IEEE International Reliability Physics Symposium (IRPS).
A. Cabrini,
G. Torelli,
R. Degraeve,
2015,
2015 IEEE International Electron Devices Meeting (IEDM).
R. Degraeve,
L. Goux,
B. Govoreanu,
2015,
2015 Symposium on VLSI Technology (VLSI Technology).
L. Goux,
B. Govoreanu,
S. Kundu,
2017,
2017 Symposium on VLSI Technology.
L. Goux,
B. Govoreanu,
S. Kundu,
2017,
2017 IEEE International Electron Devices Meeting (IEDM).
R. Degraeve,
L. Goux,
B. Govoreanu,
2012,
2012 IEEE International Integrated Reliability Workshop Final Report.
L. Goux,
B. Govoreanu,
J. Van Houdt,
2018,
2018 IEEE Symposium on VLSI Technology.
R. Degraeve,
L. Goux,
B. Govoreanu,
2014,
Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
B. Govoreanu,
H. Bender,
M. Jurczak,
2016,
2016 IEEE Symposium on VLSI Technology.
R. Degraeve,
L. Goux,
B. Govoreanu,
2013,
IEEE Electron Device Letters.
R. Degraeve,
L. Goux,
B. Govoreanu,
2013,
2013 5th IEEE International Memory Workshop.
R. Degraeve,
B. Kaczer,
D. Linten,
2015,
2015 IEEE International Electron Devices Meeting (IEDM).
R. Degraeve,
L. Goux,
A. Fantini,
2015,
2015 IEEE International Electron Devices Meeting (IEDM).
R. Delhougne,
R. Degraeve,
L. Goux,
2020,
2020 IEEE Symposium on VLSI Technology.
R. Degraeve,
L. Goux,
A. Fantini,
2016,
2016 IEEE Symposium on VLSI Technology.
R. Degraeve,
L. Goux,
Z. Chai,
2019,
2019 Symposium on VLSI Technology.
R. Delhougne,
R. Degraeve,
L. Goux,
2019,
2019 IEEE International Electron Devices Meeting (IEDM).
R. Degraeve,
L. Goux,
Z. Chai,
2019,
2019 IEEE International Electron Devices Meeting (IEDM).
R. Degraeve,
L. Goux,
B. Govoreanu,
2014,
2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers.