A. Ney

A new design-for-test technique for SRAM core-cell stability faults

Arnaud Virazel, Luigi Dilillo, Patrick Girard, 2009, 2009 Design, Automation & Test in Europe Conference & Exhibition.

A Design-for-Diagnosis Technique for SRAM Write Drivers

Arnaud Virazel, Patrick Girard, Serge Pravossoudovitch, 2008, 2008 Design, Automation and Test in Europe.

Slow Write Driver Faults in 65nm SRAM Technology: Analysis and March Test Solution

Arnaud Virazel, Patrick Girard, Serge Pravossoudovitch, 2007, 2007 Design, Automation & Test in Europe Conference & Exhibition.