Kyung Tae Do

Statistical Leakage Estimation Based on Sequential Addition of Cell Leakage Currents

Young Hwan Kim, Wook Kim, Kyung Tae Do, 2010, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

Adaptive delay monitoring for wide voltage-range operation

Kiyoung Choi, Yonghwan Kim, Wook Kim, 2016, 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE).

Early-life-failure detection using SAT-based ATPG

Bernd Becker, Matthias Sauer, Subhasish Mitra, 2013, 2013 IEEE International Test Conference (ITC).

Comparison of characterization methods for statistical analysis of SoC designs

Young Hwan Kim, Wook Kim, Kyung Tae Do, 2008, 2008 5th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology.

Detection of early-life failures in high-K metal-gate transistors and ultra low-K inter-metal dielectrics

Bernd Becker, Matthias Sauer, Subhasish Mitra, 2013, Proceedings of the IEEE 2013 Custom Integrated Circuits Conference.

Thermal-aware body bias modulation for high performance mobile core

Wook Kim, Hyo-Sig Won, Kee Sup Kim, 2012, 2012 International SoC Design Conference (ISOCC).

Clock domain crossing aware sequential clock gating

Manish Kumar, Jianfeng Liu, Abhishek Ranjan, 2015, 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE).

Monte Carlo Simulation for a SoC Design Using the Convergence Condition of Confidence Interval

Young-Hwan Kim, Kyung Tae Do, Dai Joon Hyun, 2007 .

Timing modeling of latch-controlled sub-systems

Young Hwan Kim, Kyung Tae Do, Haeng Seon Son, 2007, Integr..

Sequential analysis driven reset optimization to improve power, area and routability

Jianfeng Liu, Abhishek Ranjan, Mohit Kumar, 2016, 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE).

Power modeling of synthesizable soft macros

Young Hwan Kim, Kyung Tae Do, Yang Hyo Kim, 2004 .