P. C. Juan

The effect of electrode material on the electrical conduction of metal-Pb(Zr0.53Ti0.47)O3-metal thin film capacitors

P. C. Juan, H. C. Chou, J. Y. M. Lee, 2005, Microelectron. Reliab..

Leakage current mechanism and effect of Y2O3 doped with Zr high-K gate dielectrics

K. C. Lin, C. H. Liu, P. C. Juan, 2015, Microelectron. Reliab..

Ferroelectric of HfO2 dielectric layer sputtered with TiN or ZrN for sandwich-like metal-insulator-metal capacitors

K. C. Lin, Y. C. Kuo, P. C. Juan, 2017, Microelectron. Reliab..