Takaki Yoshida

Transport-reaction model for interface state build-up at the Si-SiO2 interface

Takahiro Iizuka, Takaki Yoshida, 1999 .

Solving the Speed Versus Accuracy Crisis

Mitiko Miura-Mattausch, Takaki Yoshida, Norio Sadachika, 2006 .

Practical application of automated fault diagnosis for stuck-at, bridging, and measurement condition dependent faults in fully scanned sequential circuits

Takaki Yoshida, Masafumi Watari, Akira Motohara, 1999, Proceedings Eighth Asian Test Symposium (ATS'99).

A new approach for low-power scan testing

Takaki Yoshida, Masafumi Watari, 2003, International Test Conference, 2003. Proceedings. ITC 2003..

HiSIM-LDMOS/HV: A Complete Surface-Potential-Based MOSFET Model for High Voltage Applications

Takaki Yoshida, Norio Sadachika, Masataka Miyake, 2008 .

MD-SCAN method for low power scan testing

Takaki Yoshida, Masafumi Watari, 2002, Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02)..

A New Solution to Power Supply Voltage Drop Problems in Scan Testing

Takaki Yoshida, Masafumi Watari, 2004, IEICE Trans. Inf. Syst..

An effective fault simulation method for core based LSI

Takaki Yoshida, Takashi Mizokawa, Reisuke Shimoda, 1997, Proceedings Sixth Asian Test Symposium (ATS'97).

Modeling of Floating-Body Effect in Silicon-on-Insulator Metal-Oxide-Silicon Field-Effect Transistor with Complete Surface-Potential-Based Description

Mitiko Miura-Mattausch, Takaki Yoshida, Norio Sadachika, 2008 .