Peter C. Walters

On-wafer measurement uncertainty for 3-terminal active millimetre-wave devices

Roger D. Pollard, J. R. Richardson, Patrice Gamand, 1992, GaAs IC Symposium Technical Digest 1992.

The effects of process variations on microstrip wafer calibration

Roger D. Pollard, J. R. Richardson, Peter C. Walters, 1993, 1993 IEEE Instrumentation and Measurement Technology Conference.

Transit time MESFET phase shifter

Roger D. Pollard, J. R. Richardson, Peter C. Walters, 1992 .