G. R. Babu

X-ray excited luminescence of Sr1−xEuxF2+x solid solutions

K. Inabe, K. Somaiah, S. Nakamura, 2000 .

Crystalline phase dependent electrical properties of Mg incorporated tetragonal phase stabilized ZrO2 high-κ dielectric layer in Si based MOS capacitors

P. Thangadurai, J. Bhanu, A. Amutha, 2018, Materials Science in Semiconductor Processing.

Influence of Mg ion concentration in ZrO2 gate dielectric layered silicon based MOS capacitors for memory applications: Thorough understanding of conduction processes

P. Thangadurai, J. Bhanu, G. R. Babu, 2019, Materials Science in Semiconductor Processing.