Annunziata Sanseverino

发表

Reliability of Medium Blocking Voltage Power VDMOSFET in Radiation Environment

A. Candelori, Francesco Iannuzzo, Giovanni Busatto, 2003, Microelectron. Reliab..

Analysis of Current in Pulsating DC Link Converter with Zero Voltage Transition

Giovanni Busatto, Francesco Velardi, Carmine Abbate, 2020, 2020 22nd European Conference on Power Electronics and Applications (EPE'20 ECCE Europe).

Scattering parameter approach applied to the stability analysis of power IGBTs in short circuit

Francesco Iannuzzo, Giovanni Busatto, Francesco Velardi, 2013, Microelectron. Reliab..

A special test structure for the measurement of the injection dependent series resistance of power diodes

Santolo Daliento, Annunziata Sanseverino, Salvatore Bellone, 1999, ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307).