Alessandra Cascio

发表

Reliability of Medium Blocking Voltage Power VDMOSFET in Radiation Environment

A. Candelori, Francesco Iannuzzo, Giovanni Busatto, 2003, Microelectron. Reliab..

Total ionizing dose reliability of thin SiO2 in PowerMOSFET devices

Giuseppe Currò, Alessandra Cascio, A. Cavagnoli, 2007, Microelectron. Reliab..

Modeling Techniques and Virtual Prototyping of Silicon Carbide MOSFET and IGBT Power Modules

Gaetano Bazzano, Daniela Cavallaro, Alessandra Cascio, 2020, 2020 2nd IEEE International Conference on Industrial Electronics for Sustainable Energy Systems (IESES).

The Role of the Parasitic BJT Parameters on the Reliability of New Generation Power MOSFET during Heavy Ion Exposure

Francesco Iannuzzo, Giovanni Busatto, Alberto Porzio, 2004, Microelectron. Reliab..

Technology Changes Influence on the Reliability of Medium Voltage Power MOSFET’s in Radiation Environment

Francesco Iannuzzo, Giovanni Busatto, Annunziata Sanseverino, 2006 .