P. Lall

Tutorial: temperature as an input to microelectronics-reliability models

P. Lall, P. Lall, 1996, IEEE Trans. Reliab..

AN OVERVIEW OF MULTICHIP MODULES

P. Lall, Shrikar Bhagath, 1993 .

Perspectives to understand risks in the electronic industry

A. Dasgupta, P. Lall, D. K. Anand, 1997 .