C.J. Wang

A new on-state drain-bias TDDB lifetime model and HCI effect on drain-bias TDDB of ultra thin oxide

K. Wu, P.J. Liao, Y.S. Tsai, 2008, 2008 IEEE International Reliability Physics Symposium.

A new TDDB lifetime bi-model for eDRAM MIM capacitor with ZrO2 high-k dielectrics

K. Wu, S. Chang, C. Chen, 2008, 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits.