T. Kuwayama

In situ measurement of surface potential developed on MgO thin film surface under ion irradiation using ion scattering spectroscopy

M. Nishitani, Y. Takai, T. Nagatomi, 2009 .

Application of ion scattering spectroscopy to measurement of surface potential of MgO thin film under ion irradiation

M. Nishitani, Y. Takai, T. Nagatomi, 2008 .

Interface recombination velocity of silicon-on-insulator wafers measured by microwave reflectance photoconductivity decay method with electric field

Masaya Ichimura, Eisuke Arai, M. Ichimura, 2003 .