N. Raghavan
发表
N.L. Prabhu,
N. Raghavan,
N. Raghavan,
2020,
2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
K. Yamane,
N. Raghavan,
K.L. Pey,
2019,
2019 IEEE International Reliability Physics Symposium (IRPS).
Krishna Vasudevan,
K. S. Swarup,
U. Grossmann,
2006
.
K. L. Pey,
N. Raghavan,
F. Zhang,
2020,
2020 IEEE International Reliability Physics Symposium (IRPS).
Cher Ming Tan,
Guangyu Huang,
Chase Wang,
2007,
2007 2nd IEEE Conference on Industrial Electronics and Applications.
G. Groeseneken,
D. Linten,
N. Horiguchi,
2016,
2016 IEEE International Electron Devices Meeting (IEDM).
V. B. Naik,
N. L. Chung,
K. L. Pey,
2020,
2020 IEEE International Reliability Physics Symposium (IRPS).
Cher Ming Tan,
N. Raghavan,
2007,
2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits.
K. L. Pey,
N. Raghavan,
S. Mei,
2018,
IEEE Transactions on Electron Devices.
N. Raghavan,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
N. Raghavan,
K.L. Pey,
M. Bosman,
2020,
2020 IEEE International Reliability Physics Symposium (IRPS).
L. Larcher,
N. Raghavan,
J.H. Lim,
2018,
2018 IEEE International Electron Devices Meeting (IEDM).
K. Kakushima,
H. Iwai,
Z. R. Wang,
2011,
2011 International Reliability Physics Symposium.
Kin Leong Pey,
N. Raghavan,
K. Shubhakar,
2013,
2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS).
N. Raghavan,
X. Li,
K. Pey,
2010,
2010 IEEE International Reliability Physics Symposium.
Xing Wu,
Kin Leong Pey,
N. Raghavan,
2012,
2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology.
T. Kauerauf,
N. Raghavan,
X. Wu,
2011,
2011 International Reliability Physics Symposium.
A. Ranjan,
N. Raghavan,
K. Shubhakar,
2018,
Scientific Reports.
L. Larcher,
N. Raghavan,
X. Wu,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
N. Raghavan,
J.B. Tan,
A. Heryanto,
2010,
2010 IEEE International Reliability Physics Symposium.
N. Raghavan,
X. Wu,
X. Li,
2010,
2010 IEEE International Reliability Physics Symposium.
N. Raghavan,
X. Wu,
M. Bosman,
2014,
2014 IEEE International Conference on Electron Devices and Solid-State Circuits.