I. Hendrickx

In situ testing of large machines: Alternative methods for conducted emission measurements

F. Vanhee, J. Catrysse, J. Knockaert, 2008, 2008 IEEE International Symposium on Electromagnetic Compatibility.

In situ testing of large machines: Alternative method for radiated emission measurement

F. Vanhee, J. Catrysse, I. Hendrickx, 2008, 2008 IEEE International Symposium on Electromagnetic Compatibility.