Do-Won Kim

Enhanced Switching Reliability of Sol–Gel-Processed Y2O3 RRAM Devices Based on Y2O3 Surface Roughness-Induced Local Electric Field

I. Kang, J. Bae, Jaewon Jang, 2022, Materials.

Flexible Sol-Gel—Processed Y2O3 RRAM Devices Obtained via UV/Ozone-Assisted Photochemical Annealing Process

I. Kang, J. Bae, Jaewon Jang, 2022, Materials.