L. Ye

Retention-failure mechanism of TaN∕CuxO∕Cu resistive memory with good data retention capability

Yinyin Lin, P. Zhou, H. Wu, 2009 .

The Temperature Dependence in Nanoresistive Switching of HfAlO

Qingqing Sun, P. Zhou, Lin Chen, 2012, IEEE Transactions on Nanotechnology.

High-k gate oxides integration of graphene based infrared detector: High-k gate oxides integration of graphene based infrared detector

Qingqing Sun, P. Zhou, Lin Chen, 2012 .

In Situ Observation of Compliance-Current Overshoot and Its Effect on Resistive Switching

P. Zhou, H.J. Wan, P. Zhou, 2010, IEEE Electron Device Letters.

Effect of concurrent joule heat and charge trapping on RESET for NbAlO fabricated by atomic layer deposition

Peng-Fei Wang, David-Wei Zhang, Qingqing Sun, 2013, Nanoscale Research Letters.