J. Wu

Retention-failure mechanism of TaN∕CuxO∕Cu resistive memory with good data retention capability

Yinyin Lin, P. Zhou, H. Wu, 2009 .

Linear Scaling of Reset Current Down to 22-nm Node for a Novel $\hbox{Cu}_{x}\hbox{Si}_{y}\hbox{O}$ RRAM

Y. Liu, J. G. Wu, Y. Y. Lin, 2012, IEEE Electron Device Letters.

A Systematic Investigation of TiN/CuxO/Cu RRAM with Long Retention and Excellent Thermal Stability

J. G. Wu, Y. Y. Lin, P. Zhou, 2009, 2009 IEEE International Memory Workshop.

Technology and circuit optimization of resistive RAM for low-power, reproducible operation

Jian Wu, He Qian, Huaqiang Wu, 2014, 2014 IEEE International Electron Devices Meeting.

A 0.13µm 8Mb logic based CuxSiyO resistive memory with self-adaptive yield enhancement and operation power reduction

G. Chen, R. Huang, X. Y. Xue, 2012, 2012 Symposium on VLSI Circuits (VLSIC).