S. Pateras
发表
Ting-Pu Tai,
Steve Pateras,
Ting-Pu Tai,
2017,
2017 International Symposium on VLSI Design, Automation and Test (VLSI-DAT).
Benoit Nadeau-Dostie,
Stephen Pateras,
Harry Hulvershorn,
1999,
International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).
Thomas J. Snethen,
William V. Huott,
Stephen Pateras,
1997,
IBM J. Res. Dev..
R. Chandramouli,
S. Pateras,
R. Chandramouli,
1996
.
S. Pateras,
B. Koenemann,
B. Koenemann,
1996,
IEEE Technical Applications Conference. Northcon/96. Conference Record.
Stephen Pateras,
Martin S. Schmookler,
S. Pateras,
1995,
Proceedings of 1995 IEEE International Test Conference (ITC).