V. Ocheretnij

Self-checking code-disjoint carry-select adder with low area overhead by use of add1-circuits

Michael Gössel, Egor S. Sogomonyan, Daniel Marienfeld, 2004, Proceedings. 10th IEEE International On-Line Testing Symposium.

A Signature Analysis Technique for the Identification of Failing Vectors with Application to Scan-BIST*

Krishnendu Chakrabarty, Michael Gössel, Vitalij Ocheretnij, 2004, J. Electron. Test..

Modulo p = 3 Checking for a Carry Select Adder

M. Gössel, D. Marienfeld, V. Ocheretnij, 2006, J. Electron. Test..

A modulo p checked self-checking carry select adder

Michael Gössel, Egor S. Sogomonyan, Daniel Marienfeld, 2003, 9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003..