Qiuling Qiu

Evaluation of stress voltage on off-state time-dependent breakdown for GaN MIS-HEMT with SiN x gate dielectric

Chen-Liang Feng, Liuan Li, Zhiyuan He, 2020 .

Impact of dislocation pits on device performances and interface quality degradation for E-mode recessed-gate Al2O3/GaN MOSFETs

Qian Wu, Chen-Liang Feng, Liuan Li, 2021 .

Charge Control in Schottky-Type p-GaN Gate HEMTs With Partially and Fully Depleted p-GaN Conditions

Liuan Li, Zhisheng Wu, Zhiyuan He, 2022, IEEE Transactions on Electron Devices.

Mechanism of high conduction on the N polar face of GaN

Zhisheng Wu, Yang Liu, Qiu-ling Qiu, 2022, Journal of Applied Physics.

Analysis on abnormal forward conduction properties in GaN based JBS diode by TCAD simulation

Yang Liu, Zhenxing Liu, Qi Zhang, 2023, China International Forum on Solid State Lighting.