Wooho Jeong

P‐10: Reliability Improvement of High‐Temperature SOR Driving Using Advanced Dual‐Gate TFT Application

Tae-Young Heo, Kwang Jo Hwang, Hoonki Kim, 2012 .

Defect reduction in photon-accelerated negative bias instability of InGaZnO thin-film transistors by high-pressure water vapor annealing

Hyun Jae Kim, Y. Rim, B. Ahn, 2013 .