Yanghuan Xu

发表

Quantitative study on the relationship between the transverse thickness difference of cold-rolled silicon strip and incoming section profile based on the mechanism-intelligent model

Hongmin Liu, Xiaobao Ma, Dong-cheng Wang, 2021 .

Copper Strip Surface Defect Detection Model Based on Deep Convolutional Neural Network

Hongmin Liu, Dong-cheng Wang, Hua-xin Yu, 2021, Applied Sciences.